Doha, Qatar

Omar Elharrouss

This inventor holds 1 USPTO granted patent. Top assignee: Qatar University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Omar Elharrouss. Retrieved from https://idiyas.com/inventor/omar-elharrouss

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations of Omar Elharrouss

Introduction

Omar Elharrouss is an innovative inventor based in Doha, Qatar. He has made significant contributions to the field of object detection technology. His work focuses on enhancing the capabilities of portable devices through advanced radar and camera systems.

Latest Patents

Omar holds a patent for a "Moving object and obstacle detection portable device using a millimeter wave radar and camera." This invention encompasses systems, methods, apparatuses, and computer program products designed for detecting, identifying, and monitoring objects. One method outlined in the patent includes detecting objects using a camera and a sensor, fusing the coordinates of detected objects, and determining the accuracy of the detection through a computer vision application.

Career Highlights

Omar is currently affiliated with Qatar University, where he continues to push the boundaries of technology and innovation. His work is instrumental in developing solutions that improve safety and efficiency in various applications.

Collaborations

Omar collaborates with talented individuals such as Somaya S A Ali Al-maadeed and Noor Al-maadeed, contributing to a dynamic research environment.

Conclusion

Omar Elharrouss exemplifies the spirit of innovation through his groundbreaking work in object detection technology. His contributions are paving the way for advancements in portable detection devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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