Koenigsbach-Stein, Germany

Oliver Meisriemel

This inventor holds 1 USPTO granted patent. Top assignee: Robert Burkle Gmbh. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Oliver Meisriemel. Retrieved from https://idiyas.com/inventor/oliver-meisriemel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations by Oliver Meisriemel in UV Irradiation Technology

Introduction

Oliver Meisriemel is an innovative inventor based in Koenigsbach-Stein, Germany. He has made significant contributions to the field of UV irradiation technology, particularly in coating systems. His work focuses on enhancing the quality assurance methods used in various industries.

Latest Patents

Oliver Meisriemel holds a patent for a "UV irradiation apparatus for coating systems and quality assurance method." This apparatus is designed to coat rigid or film-like workpieces, such as furniture parts. It features a transport apparatus that moves coated workpieces through a UV irradiation region, where they are exposed to UV light from a strategically placed light source. The design includes a housing that protects the UV light source and a sensor for automated measurement of radiant flux, ensuring optimal performance and quality assurance.

Career Highlights

Oliver is currently associated with Robert Burkle GmbH, a company known for its advanced technology in coating and laminating systems. His role involves developing innovative solutions that improve the efficiency and effectiveness of coating processes.

Conclusion

Oliver Meisriemel's contributions to UV irradiation technology exemplify the importance of innovation in enhancing industrial processes. His patent reflects a commitment to quality assurance and efficiency in coating systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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