Ostfildern, Germany

Oliver Bey

This inventor holds 1 USPTO granted patent and 2 published patent applications and 3 EPO patents. Top assignee: Gehring Technologies Gmbh + Co. Kg. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Oliver Bey. Retrieved from https://idiyas.com/inventor/oliver-bey-j8dni9z2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Oliver Bey - Innovator in Laser Surface Treatment

Introduction

Oliver Bey is a notable inventor based in Ostfildern, Germany. He has made significant contributions to the field of surface treatment technology, particularly through his innovative approaches to laser applications.

Latest Patents

Oliver Bey holds a patent for "Devices for producing roughened surfaces." This invention focuses on apparatuses and methods for laser treatment, specifically laser roughening of surfaces. His work in this area has the potential to enhance various industrial applications.

Career Highlights

Oliver Bey is currently employed at Gehring Technologies GmbH & Co. KG, where he continues to develop and refine technologies related to surface treatment. His expertise in laser applications has positioned him as a key figure in his field.

Collaborations

Oliver collaborates with talented professionals such as Gerhard Flores and Martin Freitag. Together, they work on advancing technologies that improve surface treatment processes.

Conclusion

Oliver Bey's contributions to laser surface treatment technology exemplify the innovative spirit of modern inventors. His patent and ongoing work at Gehring Technologies GmbH & Co. KG highlight the importance of innovation in enhancing industrial processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…