This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignee: Carl-Zeiss-Stiftung. Active years: 2007.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2007
Title: The Innovations of Olaf Kühn
Introduction
Olaf Kühn is a notable inventor based in Suhl, Germany. He has made significant contributions to the field of optical precision measurement. His innovative approach has led to the development of a unique method that enhances the accuracy of measurements in various applications.
Latest Patents
Kühn holds a patent for a method of optimizing target quantities for optical precision measurement and the apparatus required for this process. This method involves obtaining ancillary parameters from image data of a workpiece that is to be measured. Control data for influence quantities of the target quantities are derived from these ancillary parameters. The process includes determining the courses of the ancillary parameters based on at least one influence quantity, ensuring that the courses exhibit a similar extremum of functional dependence on the influence quantities. Ultimately, an overall course of the ancillary parameters is established, leading to the identification of an extremum that serves as control data for the influence quantity.
Career Highlights
Throughout his career, Olaf Kühn has worked with prestigious organizations, including Carl Zeiss Stiftung and Volkswagen AG. His experience in these companies has allowed him to refine his skills and contribute to advancements in optical technologies.
Collaborations
Kühn has collaborated with notable colleagues such as Gerhard Linss and Uwe Nehse. These partnerships have fostered an environment of innovation and have led to the successful development of new methodologies in precision measurement.
Conclusion
Olaf Kühn's contributions to optical precision measurement through his patented methods and collaborations with esteemed colleagues highlight his importance in the field of innovation. His work continues to influence advancements in measurement technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
