Seoul, South Korea

Ok Yi Lee

This inventor holds 2 USPTO granted patents. Top assignee: Samsung Display Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ok Yi Lee. Retrieved from https://idiyas.com/inventor/ok-yi-lee-q7g1tsrq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 7.0


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Ok Yi Lee

Introduction

Ok Yi Lee is a prominent inventor based in Seoul, South Korea. She has made significant contributions to the field of display technology. Her innovative work has led to the development of a unique display device that enhances visual experiences.

Latest Patents

Ok Yi Lee holds a patent for a display device that includes a first substrate and a plurality of light-emitting elements. The device features a second substrate opposite to the first, which contains grooves designed to house wavelength conversion layers. These layers convert the wavelength of light emitted from the light-emitting elements, while color filters are placed on the conversion layers to enhance color accuracy. This invention showcases her expertise in advancing display technologies.

Career Highlights

Ok Yi Lee is currently associated with Samsung Display Co., Ltd., a leading company in the display technology sector. Her role at Samsung has allowed her to work on cutting-edge projects that push the boundaries of what is possible in display devices. Her contributions have been instrumental in the development of innovative products that cater to consumer needs.

Conclusion

Ok Yi Lee's work exemplifies the spirit of innovation in the field of display technology. Her patent and contributions to Samsung Display Co., Ltd. highlight her role as a key player in advancing visual technology. Her achievements inspire future generations of inventors and innovators.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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