Jerusalem, Israel

Ofer Abramov

This inventor holds 1 USPTO granted patent. Top assignee: Xplan Ai Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ofer Abramov. Retrieved from https://idiyas.com/inventor/ofer-abramov

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Ofer Abramov: Innovator in Camera Calibration Technology

Introduction

Ofer Abramov is a notable inventor based in Jerusalem, Israel. He has made significant contributions to the field of camera calibration technology. His innovative work focuses on optimizing camera calibration targets for 2D to 3D reconstruction.

Latest Patents

Ofer Abramov holds a patent for "Optimizing camera calibration targets for 2D to 3D reconstruction." This patent describes calibration jigs and methods used to design and fabricate these jigs. The associated workflows are utilized for determining the calibration parameters necessary to create a 2D image of a 3D scene. The calibration jig is designed in the shape of an isosceles right semi-triangular prism, ergonomically fitting an anterior-medial tibial position on a patient's leg. He has 1 patent to his name.

Career Highlights

Ofer is currently employed at Xplan AI Ltd., where he continues to develop innovative solutions in his field. His work has garnered attention for its practical applications in medical imaging and reconstruction.

Collaborations

Ofer collaborates with talented individuals such as Ilya Kovler and Hamza Abudayyeh, contributing to a dynamic work environment that fosters innovation.

Conclusion

Ofer Abramov's contributions to camera calibration technology exemplify the impact of innovative thinking in the field of imaging. His work not only advances technology but also enhances practical applications in various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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