Odis Dale Amason, Jr

Title: Odis Dale Amason, Jr.: Innovator in Integrated Circuit Testing

Introduction

Odis Dale Amason, Jr. from Austin, TX, is a distinguished inventor in the field of integrated circuit design and testing. His work centers on improving the testing methodologies for integrated circuits, which are crucial components in modern electronic devices.

Latest Patents

Odis holds a patent for "Scan based testing of an integrated circuit for compliance with timing." This innovative approach offers an enhanced design for integrated circuits (ICs), implementing a functional path for operational specifications alongside a dedicated testing path for timing compliance. His method includes input and output switching devices that facilitate the connection of flip-flop devices into functional and testing paths, optimizing the circuit’s ability to provide useful signals during both operational and testing cycles. Additionally, his design allows for the selective disabling of tristate bus drivers during the testing cycles, showcasing a sophisticated level of control that enhances the testing process.

Career Highlights

Throughout his career, Odis has made significant contributions to Motorola Corporation, a leading company in telecommunications and technology. His innovative solutions in IC testing have been instrumental in advancing the reliability and performance of electronic devices in various applications.

Collaborations

Odis has collaborated with talented individuals such as Grady L. Giles and Alfred Larry Crouch. Their teamwork has played a critical role in the development of advanced testing techniques and methodologies for integrated circuits, further establishing their impact in the field of electronics.

Conclusion

Odis Dale Amason, Jr.'s contributions to the field of integrated circuits through his patented testing methods reflect a commitment to innovation and excellence. His work not only enhances the functionality of electronic devices but also paves the way for future advancements in circuit design and testing.