Herzliya, Israel

Oded Tietz

This inventor holds 1 USPTO granted patent. Top assignee: Proofpoint, Inc.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Oded Tietz. Retrieved from https://idiyas.com/inventor/oded-tietz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Oded Tietz: Innovator in Data Exfiltration Risk Management

Introduction

Oded Tietz is a notable inventor based in Herzliya, Israel, recognized for his contributions to the field of data security. He has developed innovative methods to manage data exfiltration risks in computer networks, which is increasingly vital in today's digital landscape.

Latest Patents

Oded Tietz holds a patent for a computer-based method aimed at managing data exfiltration risk. This method involves collecting computer file management information from an organization's computer network and user activity information from various user sessions. By correlating this data, the method assesses the risk of data exfiltration based on file management information and user activity history.

Career Highlights

Oded Tietz is currently employed at Proofpoint, Inc., where he applies his expertise in data security. His work focuses on developing solutions that enhance the protection of sensitive information within organizations.

Collaborations

Oded collaborates with talented professionals such as Mayank Choudhary and Nir Barak, contributing to innovative projects that address critical security challenges.

Conclusion

Oded Tietz's work in managing data exfiltration risk showcases his commitment to enhancing cybersecurity measures. His innovative approach and collaboration with skilled colleagues position him as a significant figure in the field of data protection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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