Company Filing History:
Years Active: 2019
Title: Oberon Dixon-Luinenburg: Innovator in Semiconductor Technology
Introduction
Oberon Dixon-Luinenburg is a notable inventor based in Heverlee, Belgium. He has made significant contributions to the field of semiconductor technology, particularly through his innovative patent. His work focuses on enhancing the measurement of electrical characteristics in semiconductor components.
Latest Patents
Oberon holds a patent for a "Device and method for two-dimensional active carrier profiling of semiconductor components." This invention discloses a method for measuring an electrical characteristic of a current path. The method includes a probe for scanning spreading resistance microscopy (SSRM), a test sample contacted by the probe, a back contact on the test sample, a bias voltage source, and a logarithmic SSRM amplifier. When a modulation at a predefined frequency is applied to either the contact force of the probe or to the bias voltage, the device comprises electronic circuitry for producing in real time a signal representative of the electrical characteristic, according to the formula logA=±V±log(dV)+V. Oberon has 1 patent to his name.
Career Highlights
Oberon is currently associated with Imec Vzw, a leading research and innovation hub in nanoelectronics and digital technologies. His work at Imec has allowed him to push the boundaries of semiconductor research and development.
Collaborations
Oberon collaborates with talented individuals in his field, including Kristof Paredis and Umberto Celano. These collaborations enhance the innovative environment at Imec and contribute to the advancement of semiconductor technologies.
Conclusion
Oberon Dixon-Luinenburg is a prominent figure in semiconductor innovation, with a focus on improving measurement techniques for electrical characteristics. His contributions through his patent and work at Imec Vzw highlight his commitment to advancing technology in this critical field.