Grand Prairie, TX, United States of America

Nylah Ann McClellan DePass

This inventor holds 1 USPTO granted patent. Top assignee: Tableau Software, Inc.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nylah Ann McClellan DePass. Retrieved from https://idiyas.com/inventor/nylah-ann-mcclellan-depass

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Nylah Ann McClellan DePass: Innovator in Data Analytics

Introduction

Nylah Ann McClellan DePass is a distinguished inventor based in Grand Prairie, Texas. She has made significant contributions to the field of data analytics, showcasing her innovative spirit through her patent portfolio.

Latest Patents

Nylah holds a patent for a "Schema Viewer Searching for a Data Analytics Platform." This invention presents a method for analyzing data from various sources by enabling user interaction through a schema region and a search box. The invention allows users to filter data fields based on specified parameters, thus enhancing the user experience and facilitating more efficient data analysis.

Career Highlights

Currently, Nylah is a key team member at Tableau Software, Inc., where she leverages her skills and knowledge to drive innovation in data visualization and analytics. Her contributions continue to help shape the future of data analysis tools.

Collaborations

Throughout her career, Nylah has collaborated with a talented team, including her coworkers Thomas Nhan and Elaine Weatherfield Sulc. Their collective efforts contribute to the advancement of technologies in the data analytics space.

Conclusion

Nylah Ann McClellan DePass exemplifies the spirit of innovation with her patent and contributions to data analytics. As she continues to work with Tableau Software, Inc., her future endeavors promise to further impact the industry substantially.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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