Franklin, TN, United States of America

Norman Baylis Purvis, Jr

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Nodality, Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Norman Baylis Purvis, Jr. Retrieved from https://idiyas.com/inventor/norman-baylis-purvis-jr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 33(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Innovations by Norman Baylis Purvis, Jr.

Introduction

Norman Baylis Purvis, Jr. is an accomplished inventor based in Franklin, TN (US). He has made significant contributions to the field of fluorescence instrumentation through his innovative ideas and patents. His work focuses on enhancing the accuracy and reliability of fluorescence detection methods.

Latest Patents

One of Purvis's notable patents is the "Microbead kit and method for quantitative calibration and performance monitoring of a fluorescence instrument." This invention involves fluorescently labeled microsphere calibration and quality control particles. These particles are essential for establishing standardized fluorescence detector setups, monitoring daily quality control of flow cytometers, and providing quantitative calibration of fluorescence detectors in traceable units of measure, specifically molecules equivalent soluble fluorescence (MESF).

Career Highlights

Purvis is currently associated with Nodality, Inc., where he continues to apply his expertise in fluorescence technology. His work at the company emphasizes the importance of precise calibration and quality control in fluorescence-based measurements.

Conclusion

Norman Baylis Purvis, Jr. is a key figure in the advancement of fluorescence instrumentation, with his innovative patent contributing to improved calibration and monitoring techniques. His dedication to enhancing scientific measurement methods is commendable.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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