Osaka, Japan

Noriyuki Jitousho

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Panasonic Corporation. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Noriyuki Jitousho. Retrieved from https://idiyas.com/inventor/noriyuki-jitousho

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Noriyuki Jitousho and His Strain Detector Invention.

Introduction

Noriyuki Jitousho is an inventor associated with Osaka, Japan, and Panasonic Corporation. His patent work includes a strain detector designed to simplify mounting and improve operation and usability.

Latest Patents

Jitousho is associated with 1 patent: “Strain Detector Having a Column-Shaped Strain Generator.” The invention describes a cylindrical strain generator that deforms under load, with a resistor element on its outer surface whose resistance changes according to the amount of strain. A connected signal-processing circuit reads the resistor’s response. Screw portions above and below the generator sandwich it, and the generator and screw portions are integrated. This design aims to reduce the number of mounting parts while supporting efficient operation and convenient use.

Career Highlights

Jitousho’s listed patent is connected to Panasonic Corporation and focuses on a practical sensor design that combines structural components to simplify installation.

Collaborations

Katsuhiko Omoto and Akira Matsuura are identified as Jitousho’s coworkers.

Conclusion

Noriyuki Jitousho’s strain detector patent presents an integrated approach to load sensing, with the goal of reducing mounting components and improving usability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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