Chiba, Japan

Norio Shibiya

This inventor holds 1 USPTO granted patent. Top assignee: Seiko Instruments Inc. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Norio Shibiya. Retrieved from https://idiyas.com/inventor/norio-shibiya

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Norio Shibiya - Innovator from Chiba, Japan

Introduction

Norio Shibiya, hailing from Chiba, Japan, is a noteworthy inventor recognized for his contributions to the field of horology. As an inventive mind at Seiko Instruments Inc., he has made significant strides in improving timekeeping devices.

Latest Patents

Shibiya holds a patent for a "Clock with a mainspring wound state indicator." This innovation enhances the utility of traditional clocks by indicating the status of the mainspring, allowing users to maintain optimal functionality.

Career Highlights

At Seiko Instruments Inc., Norio Shibiya has dedicated his career to pushing the boundaries of watchmaking technology. His efforts in developing user-friendly indicators in clocks showcase his commitment to enhancing consumer experience and reliability in timekeeping.

Collaborations

Throughout his career, Shibiya has collaborated with esteemed colleagues such as Koichiro Jujo and Katsuyoshi Takizawa. These partnerships have fostered an environment of creativity and innovation, leading to the successful development of new and improved timekeeping solutions.

Conclusion

Norio Shibiya's contributions reflect the spirit of innovation at Seiko Instruments Inc. As he continues to create impactful inventions, his work not only exemplifies technological advancements but also enhances the understanding of horology in modern society.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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