Hitachinaka, Japan

Norio Kawamura


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2010

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Norio Kawamura: Innovator in Electron Capture Detection

Introduction

Norio Kawamura is a distinguished inventor based in Hitachinaka, Japan. He is known for his significant contributions to the field of electron capture detection technology. His innovative work has led to advancements in measuring trace organic components, enhancing the efficiency and selectivity of qualitative procedures.

Latest Patents

Kawamura holds a patent for an "Electron capture detector and nonradiative electron capture detector." This invention aims to facilitate the measurement of trace organic components while improving the qualitative procedure's efficiency through selectivity. The technology utilizes metastable helium obtained by direct-current glow discharge to ionize Penning gas and dopant gas in a space isolated from the discharge part. This process enhances the ionization efficiency of the components being measured, resulting in an intensified ion current. By selecting appropriate dopant and Penning gases, Kawamura's invention imparts selectivity, allowing for precise measurements of trace organic components.

Career Highlights

Kawamura is associated with Hitachi High-Tech Science Systems Corporation, where he has made notable contributions to research and development in his field. His work has been instrumental in advancing technologies that improve analytical measurement techniques.

Collaborations

Kawamura has collaborated with esteemed colleagues such as Shinji Kurita and Masahiro Takeuchi. Their combined expertise has contributed to the success of various projects and innovations within the company.

Conclusion

Norio Kawamura's innovative work in electron capture detection exemplifies the impact of dedicated inventors in advancing technology. His contributions continue to influence the field, enhancing the capabilities of analytical measurements.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…