Kasugai, Japan

Norio Arai


Average Co-Inventor Count = 5.0

ph-index = 2

Forward Citations = 8(Granted Patents)


Location History:

  • Kasugai-shi, Aichi-ken, JP (2004)
  • late of Kasugai, JP (2004)

Company Filing History:

goldMedal3 out of 832,880 
Other
 patents

Years Active: 2004

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3 patents (USPTO):Explore Patents

Title: Norio Arai: Innovator in Temperature Measurement Technology

Introduction

Norio Arai is a notable inventor based in Kasugai, Japan. He has made significant contributions to the field of temperature measurement technology, holding a total of 3 patents. His innovative approaches have advanced the methods used to measure surface temperatures of various objects.

Latest Patents

Arai's latest patents include a temperature distribution measuring method and apparatus. This invention involves calculating the temperature at each picture element of an image of an object body. It utilizes a radiant intensity ratio from two images obtained with different wavelengths of radiation. The first filter allows transmission of radiation at a wavelength selected according to a radiant intensity curve of a black body, while the second filter permits transmission of a different wavelength within a high radiant intensity range. This method enhances the accuracy of temperature measurements across a range of conditions.

Career Highlights

Throughout his career, Norio Arai has focused on developing advanced technologies that improve measurement techniques. His work has been instrumental in creating more precise instruments for temperature analysis, which are essential in various scientific and industrial applications.

Collaborations

Arai has collaborated with notable colleagues, including Kenji Yano and Misao Iwata. These partnerships have fostered innovation and contributed to the successful development of his patented technologies.

Conclusion

Norio Arai's contributions to temperature measurement technology exemplify the impact of innovative thinking in scientific advancement. His patents reflect a commitment to enhancing measurement accuracy, which is vital for numerous applications.

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