This inventor holds 2 USPTO granted patents and 1 published patent application and 2 EPO patents. Top assignee: Hamamatsu-Photonics K.k.. Active years: 2025-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025-2026
Title: Norimichi Chinone: Innovator in Semiconductor Inspection Technology
Introduction
Norimichi Chinone is a prominent inventor based in Hamamatsu, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the area of inspection methods and devices. With a total of 2 patents to his name, Chinone's work is instrumental in advancing semiconductor inspection techniques.
Latest Patents
Chinone's latest patents include a semiconductor device inspection method and a semiconductor device inspection device. The inspection device features a measuring device that supplies power to a semiconductor device and measures its electrical characteristics. It also includes an optical scanning device that scans the semiconductor device with light intensity modulated at multiple frequencies. A lock-in amplifier acquires a characteristic signal indicating the electrical characteristics of these frequency components. The inspection device corrects the phase component of the characteristic signal at arbitrary scanning positions, using a reference phase component reflecting the electrical characteristics of the first layer in the semiconductor device. This innovative approach allows for precise specification and normalization of the phase component, leading to improved inspection results.
Career Highlights
Chinone is currently employed at Hamamatsu Photonics K.K., where he continues to develop cutting-edge technologies in semiconductor inspection. His expertise in this field has positioned him as a key figure in advancing the capabilities of semiconductor devices.
Collaborations
Chinone has collaborated with notable colleagues, including Tomonori Nakamura and Akira Shimase. These partnerships have fostered a collaborative environment that enhances innovation and research in semiconductor technology.
Conclusion
Norimichi Chinone's contributions to semiconductor inspection technology highlight his role as a leading inventor in this field. His patents reflect a commitment to improving the accuracy and efficiency of semiconductor device inspections. Through his work at Hamamatsu Photonics K.K., Chinone continues to influence the future of semiconductor technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile