Kato, Japan

Noriko Nagano

This inventor holds 1 USPTO granted patent. Top assignee: Fujitsu Corporation. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Noriko Nagano. Retrieved from https://idiyas.com/inventor/noriko-nagano-16ct90g8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Noriko Nagano: Innovator in Printer Technology

Introduction

Noriko Nagano is a prominent inventor based in Kato-gun, Japan. She has made significant contributions to the field of printer technology, particularly in methods that enhance page alignment and control.

Latest Patents

Noriko holds a patent for a "Page alignment indication method, page control method, printer system and printer device." This innovative technology involves adding a unique code to image data created by a microcomputer. The printer device can then detect this unique code independently from ordinary data analysis. The unique code consists of a sequence of identical data bytes, which facilitates page control and recovery processes based on the detection results. She has 1 patent to her name.

Career Highlights

Noriko Nagano is associated with Fujitsu Corporation, where she has been instrumental in developing advanced printing solutions. Her work has significantly improved the efficiency and reliability of printer systems.

Collaborations

Noriko has collaborated with notable colleagues, including Hiromitsu Nishimura and Takaji Fujiwara, to further enhance the capabilities of their projects.

Conclusion

Noriko Nagano's contributions to printer technology exemplify her innovative spirit and dedication to advancing the field. Her work continues to influence the development of more efficient printing systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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