Norik Janunts

Title: Norik Janunts: Innovator in Optoelectronics

Introduction

Norik Janunts is a notable inventor based in Jena, Germany. He has made significant contributions to the field of optoelectronics, holding two patents that showcase his innovative approach to technology.

Latest Patents

One of his latest patents is a "Wafer-level test method for optoelectronic chips." This method involves testing optoelectronic chips arranged on a wafer, which have electrical interfaces in the form of contact pads and optical interfaces fixed relative to them. The process includes adjusting the wafer in three steps to ensure optimal contact between the chip and the contacting module, maximizing the optical coupling.

Another significant patent is an "Assembly for detecting the intensity distribution of components of the electromagnetic field in beams of radiation." This invention combines a high-resolution two-dimensional intensity sensor array with a field vector detector array. The detector structures are formed as nanostructures, utilizing localized plasmon resonance for polarization selection of the field distribution.

Career Highlights

Norik Janunts has worked with Jenoptik GmbH, where he has applied his expertise in optoelectronics. His work has contributed to advancements in the testing and detection of electromagnetic fields.

Collaborations

He has collaborated with notable coworkers such as Tobias Gnausch and Armin Grundmann, further enhancing his contributions to the field.

Conclusion

Norik Janunts is a prominent figure in the realm of optoelectronics, with patents that reflect his innovative spirit and technical expertise. His work continues to influence advancements in the industry.