This inventor holds 1 USPTO granted patent. Top assignee: Kobelco Research Institute, Inc.. Active years: 2019.
Company Filing History:
Years Active: 2019
Title: Norihisa Harano: Innovator in Semiconductor Measurement Technology
Introduction
Norihisa Harano is a prominent inventor based in Kobe, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the area of shape measurement methods and devices. His innovative work has led to advancements that enhance the precision of semiconductor manufacturing processes.
Latest Patents
Norihisa Harano holds a patent for a shape measurement method and shape measurement device. This invention involves a measurement unit that accurately measures the cross-sectional shape of the edge part of a semiconductor wafer. Additionally, it measures the cross-sectional shape of the edge part of a support member and a laminated wafer. An analysis unit calculates the thickness of an adhesive agent by subtracting the thickness of the semiconductor wafer and the support member from the thickness of the laminated wafer. This patent showcases his expertise in improving measurement techniques in semiconductor fabrication.
Career Highlights
Harano is associated with Kobelco Research Institute, Inc., where he continues to develop innovative solutions in semiconductor technology. His work has been instrumental in enhancing the efficiency and accuracy of semiconductor manufacturing processes.
Collaborations
Some of his notable coworkers include Hidehisa Hashizume and Shunsuke Takami. Their collaborative efforts contribute to the advancement of research and development in the semiconductor industry.
Conclusion
Norihisa Harano's contributions to semiconductor measurement technology exemplify his innovative spirit and dedication to advancing the field. His patent reflects a significant step forward in ensuring precision in semiconductor manufacturing.