Yokohama, Japan

Norihiro Abe

This inventor holds 1 USPTO granted patent. Top assignee: Reliance Electric Limited. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Norihiro Abe. Retrieved from https://idiyas.com/inventor/norihiro-abe-2vwpgkzw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Norihiro Abe: Innovator in Sheet Dimension Measurement Systems

Introduction

Norihiro Abe is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of measurement systems, particularly with his innovative approach to sheet dimension measurement. His work has garnered attention for its practical applications in various industries.

Latest Patents

Norihiro Abe holds a patent for a sheet dimension measurement system. This invention is designed to enhance the accuracy and efficiency of measuring sheet dimensions, which is crucial in manufacturing and quality control processes. He has 1 patent to his name, showcasing his expertise in this specialized area.

Career Highlights

Abe is currently employed at Reliance Electric Limited, where he continues to develop and refine measurement technologies. His role at the company allows him to apply his innovative ideas in a practical setting, contributing to advancements in the industry.

Collaborations

Norihiro Abe has collaborated with fellow inventor Tatsuyuki Miyagawa. Their partnership has led to the development of new technologies and improvements in existing systems, further enhancing the capabilities of measurement solutions.

Conclusion

Norihiro Abe is a dedicated inventor whose work in sheet dimension measurement systems has made a significant impact in the field. His contributions continue to influence the industry, and his collaboration with other innovators further strengthens the advancements in measurement technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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