Tama, Japan

Norihiko Ishinohachi

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Asm IP Holding B.v.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Norihiko Ishinohachi. Retrieved from https://idiyas.com/inventor/norihiko-ishinohachi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Norihiko Ishinohachi and Plasma-Assisted Dielectric Layer Formation.

Introduction

Norihiko Ishinohachi is an inventor associated with Tama, Japan, and Asm IP Holding B.V. His listed patent concerns a plasma-assisted method for forming a dielectric material layer on a substrate.

Latest Patents

The provided information lists 1 patent for Ishinohachi: “Method of Forming Dielectric Material Layer Using Plasma.” The method describes depositing a dielectric layer by supplying a precursor and reactant to a reaction chamber while applying pulsed plasma power. It then cures the layer by providing a curing gas and carrying out two curing steps, with the second step at a higher temperature than the first.

Career Highlights

Ishinohachi’s listed patent focuses on a staged deposition and curing process for dielectric materials. The approach combines plasma-assisted deposition with sequential temperature-controlled curing.

Collaborations

The provided information names Yoshiyuki Kikuchi and Yoshio Susa as Ishinohachi’s coworkers. His listed company affiliation is Asm IP Holding B.V.

Conclusion

Norihiko Ishinohachi’s listed invention addresses dielectric layer formation through plasma-assisted deposition followed by staged curing, reflecting his contribution to materials-processing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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