Gifu, Japan

Noriharu Esaki

This inventor holds 1 USPTO granted patent. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Noriharu Esaki. Retrieved from https://idiyas.com/inventor/noriharu-esaki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 39(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Noriharu Esaki: Innovator in High-Frequency Modules

Introduction

Noriharu Esaki is a prominent inventor based in Gifu, Japan. He is known for his contributions to the field of electronics, particularly in the development of high-frequency modules. His innovative work has led to the filing of a patent that enhances the performance of electronic devices.

Latest Patents

Esaki holds a patent for a high-frequency module and electronic device using the module. This invention features a shield case designed to improve shielding performance and prevent signal leakage from circuits on printed circuit boards. The module includes a unique barrier structure and various sections that enhance its functionality.

Career Highlights

Esaki has made significant strides in his career, working with Matsushita Electric Industrial Co., Ltd. His expertise in electronic engineering has allowed him to develop solutions that address critical challenges in the industry. His work has been recognized for its impact on the performance and reliability of electronic devices.

Collaborations

Esaki has collaborated with notable colleagues, including Tomohide Ogura and Junichi Kimura. These partnerships have fostered innovation and contributed to the advancement of technology in their field.

Conclusion

Noriharu Esaki's contributions to high-frequency modules exemplify the spirit of innovation in electronics. His patent reflects a commitment to enhancing device performance and reliability. His work continues to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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