Nagoya, Japan

Noriaki Itoh

This inventor holds 1 USPTO granted patent. Top assignee: Nagoya University. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Noriaki Itoh. Retrieved from https://idiyas.com/inventor/noriaki-itoh-2jsl44l3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: Noriaki Itoh: Innovator in Defect Concentration Measurement

Introduction

Noriaki Itoh is a notable inventor based in Nagoya, Japan, recognized for his contributions to the field of surface science. His innovative methods focus on the quantitative determination of defect concentrations on surfaces, particularly in high vacuum environments. With a strong academic background, Itoh has made significant strides in understanding material properties through his patented technology.

Latest Patents

Noriaki Itoh holds a patent titled "Method of quantitative determination of defect concentration on surfaces." This innovative methodology involves determining the ablation threshold of laser fluence in relation to the surface of samples manufactured in high vacuum chambers. By employing specific laser techniques, Itoh's method accurately quantifies vacancy-type defects, adatom-type defects, and kink-type defects on surfaces. The unique approach not only enhances the understanding of surface defects but also has potential applications in various industrial and research settings.

Career Highlights

Currently, Noriaki Itoh is affiliated with Nagoya University, a prestigious institution known for its cutting-edge research and innovation. His role there enables him to collaborate with fellow researchers and contribute to advancements in materials science. His patent reflects his dedication to enhancing scientific methodologies and improving material quality through innovative techniques.

Collaborations

During his career, Noriaki has collaborated with esteemed colleagues such as Yasuo Nakai and Ken Hattori. These collaborations have allowed for a rich exchange of ideas and techniques, further propelling research in the field of defect concentration and surface analysis. Together, they have been instrumental in advancing methodologies that have broad implications for both academic research and industrial applications.

Conclusion

Noriaki Itoh stands out as a forward-thinking inventor whose work has the potential to reshape our understanding of surface defects in various materials. His patent not only showcases his innovative spirit but also his commitment to scientific advancement. With ongoing collaborations and a robust academic environment at Nagoya University, Itoh's contributions to material science are sure to inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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