Malterdingen, Germany

Norbert Werner Jauch

This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignee: Fluke Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Norbert Werner Jauch. Retrieved from https://idiyas.com/inventor/norbert-werner-jauch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2013

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Norbert Werner Jauch: A Visionary in Innovation and Invention

Introduction:

Norbert Werner Jauch, a man hailing from Malterdingen, DE, is a true visionary in the world of inventors. His relentless pursuit of innovation and commitment to pushing boundaries have solidified his place as a pioneer in technological advancements.

Latest Patents:

With a notable contribution of 1 patent to his name, Norbert's patent on Electrical Switches and Methods showcases his expertise in switch assemblies and methods for efficient electrical contact switching.

Career Highlights:

Currently working at Fluke Corporation, Norbert Werner Jauch demonstrates his passion for innovation in a leading company known for its groundbreaking contributions to the field of technology.

Collaborations:

Norbert has had the privilege of collaborating with esteemed coworkers such as Wilbur R Ames, IV and Warren H Wong at Fluke Corporation. Together, they have propelled innovative ideas and inventions that shape the landscape of technological advancements.

Conclusion:

Norbert Werner Jauch's dedication to innovation and his groundbreaking contributions reflect his status as a true visionary in the world of inventors. His work continues to inspire future generations and has significantly impacted the field of technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…