Wangen, Germany

Norbert Mörsch

This inventor holds 7 USPTO granted patents and 3 EPO patents. Top assignees: Blum-Novotest Gmbh, Diehl Ako Stiftung & Co. Kg, Ako-Werke Gmbh & Co. Kg. Active years: 2000-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Norbert Mörsch. Retrieved from https://idiyas.com/inventor/norbert-morsch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 85.7

 

Average Co-Inventor Count = 1.2

ph-index = 4

Forward Citations = 30(Granted Patents)


Company Filing History:


Years Active: 2000-2019

Loading Chart...
Loading Chart...
7 patents (USPTO):Explore Patents

Title: Norbert Mörsch: Innovator in Measuring Instruments

Introduction

Norbert Mörsch is a distinguished inventor based in Wangen, Germany. He has made significant contributions to the field of measuring instruments, holding a total of six patents. His work has had a notable impact on the industry, showcasing his expertise and innovative spirit.

Latest Patents

Among his latest patents, Norbert Mörsch has developed advanced measuring instruments that enhance precision and efficiency in various applications. These innovations reflect his commitment to improving measurement technology and addressing the needs of the market.

Career Highlights

Throughout his career, Norbert has worked with reputable companies such as Blum-Novotest GmbH and Diehl Ako Stiftung & Co. KG. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking projects in the field of measurement.

Collaborations

Norbert Mörsch has collaborated with talented individuals, including Martin Klugger and Bruno Riedter. These partnerships have fostered a creative environment that has led to the development of innovative solutions in measuring technology.

Conclusion

In summary, Norbert Mörsch is a prominent inventor whose work in measuring instruments has significantly advanced the industry. His patents and collaborations highlight his dedication to innovation and excellence in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…