Katsuta, Japan

Nobuyoshi Hashimoto

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nobuyoshi Hashimoto. Retrieved from https://idiyas.com/inventor/nobuyoshi-hashimoto-crkhmkfi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: Nobuyoshi Hashimoto: Innovator in Semiconductor Measurement Technology

Introduction

Nobuyoshi Hashimoto is a prominent inventor based in Katsuta, Japan. He has made significant contributions to the field of semiconductor technology. His innovative work has led to the development of a specialized measurement scanner that enhances the efficiency and accuracy of semiconductor manufacturing processes.

Latest Patents

Nobuyoshi Hashimoto holds 1 patent for his invention of a measurement scanner specifically designed for semiconductors. This patent reflects his commitment to advancing technology in a critical area of electronics.

Career Highlights

Hashimoto is currently employed at Hitachi, Ltd., a leading company in technology and electronics. His role at Hitachi has allowed him to work on cutting-edge projects that push the boundaries of semiconductor technology.

Collaborations

Throughout his career, Nobuyoshi Hashimoto has collaborated with notable colleagues, including Toshihiko Wada and Tadashi Ohtaka. These partnerships have fostered innovation and contributed to the success of various projects within the semiconductor industry.

Conclusion

Nobuyoshi Hashimoto's contributions to semiconductor measurement technology exemplify his dedication to innovation. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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