Company Filing History:
Years Active: 2012-2018
Title: Nobuo Tanaka: Innovator in Spin-Polarized Electron Beam Technology
Introduction
Nobuo Tanaka is a distinguished inventor based in Nagoya, Japan. He has made significant contributions to the field of electron beam technology, holding a total of 3 patents. His innovative work focuses on enhancing the capabilities of electron microscopes and coherence measurement devices.
Latest Patents
One of Tanaka's latest patents is a coherence measuring device for spin-polarized electron beams. This device involves splitting a spin-polarized electron beam into two paths using a splitter. A spin direction rotator on the first path rotates the spin direction, while a delay device introduces a time delay. The second path allows the electron beam to pass through a sample stage. The two beams are then superposed by a biprism, and their intensity distribution is measured. Coherence is determined based on the relationship between the spin direction rotation angle, delay time, and visibility of the interference fringe.
Another notable patent is an electron microscope that utilizes a polarized electron beam to achieve high-contrast images of samples. This microscope features a laser and a polarization apparatus that converts the laser beam into a circularly polarized form. A semiconductor photocathode generates a polarized electron beam when exposed to this laser. The microscope also includes a transmission electron microscope that employs the polarized electron beam, along with an intensity distribution recording apparatus that captures the intensity distribution before and after the polarization of the electron beam is reversed.
Career Highlights
Nobuo Tanaka has worked at prestigious institutions such as Nagoya University and Osaka University. His research and development efforts have significantly advanced the understanding and application of spin-polarized electron beams in various scientific fields.
Collaborations
Tanaka has collaborated with notable colleagues, including Makoto Kuwahara and Toru Ujihara. Their joint efforts have contributed to the success of various projects and innovations in electron beam technology.
Conclusion
Nobuo Tanaka's contributions to the field of electron beam technology are noteworthy. His innovative patents and collaborations have paved the way for advancements in microscopy and coherence measurement. His work continues to influence the scientific community and enhance research capabilities.