Kanagawa, Japan

Nobuo Nabeshima

This inventor holds 1 USPTO granted patent. Top assignee: Sony Corporation. Active years: 2007.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 46(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Nobuo Nabeshima: Innovator in Displacement Detection Technology

Introduction

Nobuo Nabeshima is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of displacement detection technology. His innovative approach has led to the development of a unique apparatus that enhances measurement capabilities.

Latest Patents

Nabeshima holds a patent for a displacement detection apparatus. This invention utilizes short scales to provide a long measurable range comparable to a single long scale with a short bed length. The apparatus includes a scale, a first head, and a second head that detect periodic analog signals of various types. It features a processing section that calculates differential values between positional data, a switching section for value selection, and a detection section for scale positioning. This technology represents a significant advancement in precision measurement.

Career Highlights

Nobuo Nabeshima is currently employed at Sony Corporation, where he continues to innovate and develop new technologies. His work has been instrumental in enhancing the capabilities of measurement devices. He has demonstrated a commitment to advancing the field through his inventive solutions.

Collaborations

Nabeshima has collaborated with talented coworkers, including Kayoko Taniguchi and Eiko Kanbara. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Nobuo Nabeshima's contributions to displacement detection technology exemplify his innovative spirit and dedication to advancing measurement capabilities. His patent and work at Sony Corporation highlight his role as a key figure in the field.

Profile summary based on public USPTO records.
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