This inventor holds 1 USPTO granted patent. Top assignee: Kabushiki Kaisha Ohara. Active years: 2007.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2007
Title: Nobuo Kawasaki: Innovator in Coefficient of Linear Expansion Measurement
Introduction
Nobuo Kawasaki is a distinguished inventor based in Tokyo, Japan. He is known for his innovative contributions to the field of measurement technology. His work focuses on the development of apparatuses that enhance the accuracy of scientific measurements.
Latest Patents
Kawasaki holds a patent for a "Coefficient of linear expansion measuring apparatus and coefficient of linear expansion measuring method." This apparatus includes two reflection plates that house a sample, a container filled with a gas that has a known rate of refractive index variation, and a temperature regulating member. The device utilizes a light source to irradiate the reflecting surfaces and a light receiving element to detect the intensity of reflected lights. The calculating member then determines the coefficient of linear expansion of the sample by analyzing the optical path length variation.
Career Highlights
Kawasaki is associated with Kabushiki Kaisha Ohara, where he has made significant contributions to the field of measurement technology. His innovative approach has led to advancements in how linear expansion is measured, providing valuable tools for various scientific applications.
Collaborations
Kawasaki has worked alongside notable colleagues such as Toshihide Nakajima and Masahiko Daimon. Their collaborative efforts have furthered the development of measurement technologies and enhanced the capabilities of their respective fields.
Conclusion
Nobuo Kawasaki's contributions to the field of measurement technology, particularly through his patented apparatus, demonstrate his commitment to innovation. His work continues to influence scientific measurement practices, showcasing the importance of precise measurement in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
