This inventor holds 3 USPTO granted patents. Top assignee: Olympus Optical Company, Ltd.. Active years: 2002-2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2002-2004
Title: Nobuo Fujisaki: Innovator in Substrate Inspection Technology
Introduction
Nobuo Fujisaki is a notable inventor based in Ina, Japan. He has made significant contributions to the field of substrate inspection technology. With a total of 3 patents to his name, Fujisaki's work has advanced the capabilities of inspection apparatuses used in various industries.
Latest Patents
Fujisaki's latest patents focus on an innovative apparatus for inspecting substrates. This apparatus includes a substrate holding member designed to securely hold the substrate during inspection. It features a driving mechanism that raises the substrate holding member to a predetermined angle or less. Additionally, a position coordinate detecting section is provided at the side edge of the substrate in at least two directions to detect the coordinates of any defects present. The apparatus also includes an observation system supporting section that supports a micro observation system, which can move across the surface of the substrate. The controlling section manages the movement of the micro observation system based on the position coordinates of the detected defects.
Career Highlights
Fujisaki is currently employed at Olympus Optical Company, Ltd., where he continues to develop and refine inspection technologies. His work has been instrumental in enhancing the precision and efficiency of substrate inspections, which are critical in various manufacturing processes.
Collaborations
Throughout his career, Fujisaki has collaborated with notable colleagues, including Hiroyuki Okahira and Yuzo Nakamura. These collaborations have contributed to the advancement of technology in the field of substrate inspection.
Conclusion
Nobuo Fujisaki's innovative work in substrate inspection technology has made a significant impact on the industry. His patents reflect a commitment to improving inspection processes, ensuring higher quality standards in manufacturing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
