Hyogo, Japan

Nobuhiro Shitara

This inventor holds 2 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignee: Hewlett-Packard Company. Active years: 1995-2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nobuhiro Shitara. Retrieved from https://idiyas.com/inventor/nobuhiro-shitara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 10(Granted Patents)


Location History:

  • Kobeshi, JP (1995)
  • Hyogo, JP (2001)

Company Filing History:


Years Active: 1995-2001

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2 patents (USPTO):Explore Patents

Title: Nobuhiro Shitara: Innovator in Measurement Technology

Introduction

Nobuhiro Shitara is a notable inventor based in Hyogo, Japan. He has made significant contributions to the field of measurement technology, holding a total of 2 patents. His work focuses on enhancing the performance characteristics of recording units and improving impedance measurement techniques.

Latest Patents

Shitara's latest patents include a "Measurement apparatus for use in recording unit provided with control means for controlling write and read parameters." This invention is directed toward a measuring apparatus that assesses the performance characteristics of a recording unit, which includes a recording medium divided into multiple sectors. The apparatus features a writing means for writing a signal with adjustable parameters, a control means for modifying these parameters across sectors, and a reading means for retrieving the written signal while measuring its performance.

Another significant patent is the "Contact judging circuit and contact judging method for impedance." This invention allows for accurate judgment of the contact between a device under test (DUT) and a measuring terminal using a simple circuit. The circuit injects a judging current into the voltage terminal, enabling the detection of proper contact based on impedance and current measurement values.

Career Highlights

Nobuhiro Shitara is currently employed at Hewlett-Packard Company, where he continues to innovate in measurement technologies. His work has contributed to advancements in both recording unit performance and impedance measurement methods.

Collaborations

Shitara has collaborated with notable coworkers, including Hideshi Tanaka and Yasuaki Komatsu. Their combined expertise has fostered a productive environment for innovation and development in their respective fields.

Conclusion

Nobuhiro Shitara's contributions to measurement technology through his patents and collaborations highlight his role as a significant inventor in the industry. His work continues to influence advancements in recording units and impedance measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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