Nobuhiro Obara

Title: Innovations by Nobuhiro Obara

Introduction

Nobuhiro Obara is a notable inventor based in Hitachinaka, Japan. He has made significant contributions to the field of surface inspection technology, holding two patents that showcase his innovative approach to defect detection and data management.

Latest Patents

Obara's latest patents include a surface inspection apparatus and method. This apparatus features a blocking unit that groups data items into blocks with an arbitrary number of items. The subsequent processing unit acquires data from each block, while the blocking unit adjusts the number of items based on instructions from a state monitoring unit. This ensures that data does not overflow from memory by increasing the number of blocked items when memory capacity decreases. Another patent focuses on a defect inspection apparatus and method that allows for easy assignment of threshold levels to scattered-light detectors. This system includes a stage device for samples, a laser light irradiation device, and scattered-light detectors that output image signals. The threshold level setter is designed to set levels for judging defects based on selected image signals.

Career Highlights

Nobuhiro Obara works at Hitachi High-Technologies Corporation, where he has been instrumental in developing advanced inspection technologies. His work has significantly impacted the efficiency and accuracy of surface inspections in various applications.

Collaborations

Obara collaborates with talented coworkers, including Hiroshi Kikuchi and Yuji Inoue, who contribute to the innovative projects at Hitachi High-Technologies Corporation.

Conclusion

Nobuhiro Obara's contributions to surface inspection technology through his patents demonstrate his commitment to innovation and excellence in his field. His work continues to influence the industry and improve inspection processes.