Location History:
- Yokohama, JP (2010)
- Ishioka, JP (2009 - 2011)
- Tsukuba, JP (2019)
Company Filing History:
Years Active: 2009-2019
Title: Nobuhiro Kawamata: Innovator in Probe Card Technology
Introduction
Nobuhiro Kawamata is a distinguished inventor based in Ishioka, Japan. He has made significant contributions to the field of probe card technology, particularly in the testing of optoelectronic devices. With a total of 4 patents to his name, Kawamata's work has advanced the efficiency and effectiveness of testing methodologies in the semiconductor industry.
Latest Patents
Kawamata's latest patents include innovative technologies such as the LED light source probe card technology for testing CMOS image scan devices. This technology enhances wafer-scale testing by incorporating an LED light source for each device under test. The probe card utilizes a phosphor illuminated by the LED to provide light, ensuring uniform illumination through a closed-loop control system. Additionally, he has developed a probe card assembly with an interchangeable probe insert, allowing for easy replacement and configuration of probes for testing devices.
Career Highlights
Kawamata is currently employed at FormFactor, Inc., where he continues to push the boundaries of probe card technology. His work has been instrumental in improving testing processes for various optoelectronic devices, making significant strides in the semiconductor testing industry.
Collaborations
Some of his notable coworkers include Carl V Reynolds and Benjamin N Eldridge, who have collaborated with him on various projects within the field.
Conclusion
Nobuhiro Kawamata's contributions to probe card technology have established him as a key figure in the semiconductor testing industry. His innovative patents and ongoing work at FormFactor, Inc. continue to influence advancements in this critical field.