Nobuhiro Katsuma

Title: Nobuhiro Katsuma: Innovator in Semiconductor Inspection Technology

Introduction

Nobuhiro Katsuma is a notable inventor based in Shiga, Japan. He has made significant contributions to the field of semiconductor inspection technology. With a total of 2 patents, his work focuses on enhancing the efficiency and accuracy of inspection devices.

Latest Patents

Katsuma's latest patents include an innovative inspection device and method. The device features a first conductive contact that connects a first electrode of an inspection circuit board to an external electrode of a semiconductor integrated circuit, arranged in a fixed member. Additionally, a second conductive contact connects a second electrode of a wiring board to another external electrode of the semiconductor integrated circuit, positioned in a movable member. A third conductive contact links one third electrode of the inspection circuit board to another third electrode of the wiring board, also located in the movable member. The other third electrode is connected to the second electrode. When the movable member shifts to the contacting position, the second conductive contact engages with the other external electrode, while the third conductive contact connects with the one third electrode.

Career Highlights

Katsuma is currently employed at Panasonic Corporation, where he continues to develop cutting-edge technologies in semiconductor inspection. His work has been instrumental in advancing the capabilities of inspection devices, making them more reliable and efficient.

Collaborations

Throughout his career, Katsuma has collaborated with talented individuals such as Keisuke Inoue and Seiichi Kageyama. These collaborations have fostered innovation and contributed to the success of various projects.

Conclusion

Nobuhiro Katsuma is a distinguished inventor whose work in semiconductor inspection technology has made a significant impact. His innovative patents and collaborations highlight his commitment to advancing the field.