This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Denki Kabushiki Kaisha. Active years: 1987.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1987
Title: Nobuaki Yakoh: Innovator in Ultrasonic Flaw Detection
Introduction
Nobuaki Yakoh is a prominent inventor based in Kanagawa, Japan. He has made significant contributions to the field of ultrasonic flaw detection, particularly in thick wall steel pipes. His innovative methods have enhanced the reliability of flaw detection, which is crucial for various industrial applications.
Latest Patents
Nobuaki Yakoh holds a patent for a method of detecting flaws in thick wall steel pipes using ultrasonic technology. This method involves the use of a shear wave mode to detect internal surface flaws in the pipes. The transmitting probe is positioned at a slant relative to both the longitudinal and transverse directions of the pipe. This configuration allows the shear wave to be incident on the pipe at a refraction angle of 35 to 70 degrees. Consequently, the ultrasonic beam effectively impinges on surface flaws at the same angle, ensuring accurate detection.
Career Highlights
Nobuaki Yakoh is associated with Mitsubishi Electric Corporation, where he has applied his expertise in ultrasonic technology. His work has been instrumental in advancing the methods used for flaw detection in industrial materials. With a focus on innovation, he continues to contribute to the field through his research and development efforts.
Collaborations
Nobuaki Yakoh collaborates with Mitsuhiro Koike, who is also involved in similar research areas. Their partnership has fostered advancements in ultrasonic detection methods, enhancing the overall effectiveness of their work.
Conclusion
Nobuaki Yakoh's contributions to ultrasonic flaw detection represent a significant advancement in industrial technology. His innovative methods and collaboration with fellow researchers continue to impact the field positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
