Tokyo, Japan

Noboru Takamura

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi-Omron Terminal Solutions, Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Noboru Takamura. Retrieved from https://idiyas.com/inventor/noboru-takamura-kvumawvf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2013

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Noboru Takamura: Innovator in Biometric Authentication

Introduction

Noboru Takamura is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of biometric authentication technology. His work focuses on enhancing user security through innovative methods of authentication.

Latest Patents

Takamura holds a patent for a biometric authentication apparatus and method. This invention utilizes finger and palm print information, along with vein information, to perform user authentication. The technology aims to provide a more secure and reliable means of verifying identity.

Career Highlights

Noboru Takamura is associated with Hitachi-Omron Terminal Solutions Corporation. His role in the company has allowed him to develop and refine his innovative ideas in biometric technology. With a patent count of 1 patent, he continues to push the boundaries of what is possible in user authentication.

Collaborations

Takamura has worked alongside notable colleagues such as Eiji Makimoto and Kunihiro Nomura. Their collaborative efforts have contributed to advancements in the field of biometric systems.

Conclusion

Noboru Takamura's work in biometric authentication represents a significant step forward in security technology. His innovative approach and dedication to improving user authentication methods highlight his importance in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…