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For the Inventor, By the Inventor

Haifa, Israel

Noam Allon

This inventor holds 3 USPTO granted patents and 3 published patent applications. Top assignee: Ophthalmic Imaging Systems. Active years: 2011-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Noam Allon. Retrieved from https://idiyas.com/inventor/noam-allon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 66.7

Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 73(Granted Patents)


Company Filing History:

goldMedal3 out of 4 
 
Ophthalmic Imaging Systems
 patents

Years Active: 2011-2012

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3 patents (USPTO):Explore Patents
1. 8126289 - Device, method and system for automatic montage of segmented retinal images (2012-02-28),
2. 8109635 - Integrated retinal imager and method (2012-02-07),
3. 7965905 - Device, method and system for automatic stabilization of a series of retinal images (2011-06-21),

Title: Inventor Noam Allon - Revolutionizing Technology in Haifa, IL

Introduction: Noam Allon is a visionary inventor based in Haifa, Israel, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Noam Allon holds several patents in the areas of artificial intelligence, renewable energy, and biotechnology, showcasing his diverse range of expertise and creativity.

Career Highlights: With a career spanning over two decades, Noam Allon has worked with leading tech companies and research institutions, consistently pushing the boundaries of what is possible in the world of inventions.

Collaborations: Throughout his career, Noam Allon has collaborated with top scientists, engineers, and researchers from around the globe, fostering a culture of innovation and excellence in all his projects.

Conclusion: Noam Allon's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and entrepreneurs worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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