Niv Sarig

Title: Niv Sarig: Innovator in Metrology and Image Processing

Introduction

Niv Sarig is a notable inventor based in Kfar Saba, Israel. He has made significant contributions to the fields of metrology and image processing, holding a total of 2 patents. His innovative approaches have paved the way for advancements in measurement planning and object modeling.

Latest Patents

Niv Sarig's latest patents include a "Method and system for planning metrology measurements." This method provides inverse total measurement uncertainty (TMU) analysis equations for upper and lower confidence limits, enabling the estimation of input parameters prior to conducting experiments. Another significant patent is for the "Modelization of objects in images," which involves aligning a parameterized model with an object in an image and adjusting the model to match the contours of the object. This system also includes an animation method that hierarchically matches a rigid model to an object in an image.

Career Highlights

Throughout his career, Niv Sarig has worked with esteemed companies such as Yeda Research and Development Company and Nova Measuring Instruments. His experience in these organizations has contributed to his expertise in metrology and image processing technologies.

Collaborations

Niv has collaborated with notable individuals in his field, including Yosef Yomdin and Gregory Dinkin. These partnerships have further enhanced his innovative work and contributions to technology.

Conclusion

Niv Sarig's work exemplifies the spirit of innovation in metrology and image processing. His patents and collaborations reflect his commitment to advancing technology in these fields.