This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Gowin Semiconductor Corporation. Active years: 2025.
Company Filing History:
Years Active: 2025
Title: Niu Li: Innovator in Error Correcting Code Testing
Introduction
Niu Li is a prominent inventor based in Guangzhou, China. He has made significant contributions to the field of semiconductor technology, particularly in the testing of error correcting codes. His innovative approach has led to advancements in the efficiency of testing systems used in Field Programmable Gate Arrays (FPGAs).
Latest Patents
Niu Li holds a patent for a "Method and apparatus for testing error correcting code (ECC) function of FPGA on-chip block random access memory (BRAM)." This patent describes a system and method that includes control modules, multiple BRAMs with ECC functions, and parity bit comparison modules. The design allows for efficient testing of ECC functions by reducing the required test stimuli and interactions with upper computer ports, thereby enhancing test efficiency.
Career Highlights
Niu Li is currently employed at Gowin Semiconductor Corporation, where he continues to develop innovative solutions in semiconductor technology. His work has been instrumental in improving the reliability and performance of electronic systems.
Collaborations
Niu Li collaborates with talented individuals such as Jingxiang Wang and Yue Han, contributing to a dynamic team focused on advancing semiconductor technologies.
Conclusion
Niu Li's contributions to the field of error correcting code testing exemplify his innovative spirit and dedication to enhancing technology. His work at Gowin Semiconductor Corporation and his patent achievements highlight his role as a key figure in the semiconductor industry.