Company Filing History:
Years Active: 2023
Title: Nitin Singh Malik: Innovator in Electron Beam Examination Technology
Introduction
Nitin Singh Malik is a prominent inventor based in Bengaluru, India. He has made significant contributions to the field of metrology measurement through his innovative patent. His work focuses on enhancing image acquisition techniques using electron beam examination tools.
Latest Patents
Nitin Singh Malik holds a patent for a system and method titled "Image acquisition by an electron beam examination tool for metrology measurement." This invention involves obtaining a sequence of frames of a specimen area, transforming frames to derive a reference frame, and determining patterns that inform about structural features of the specimen. The process generates corrected frames and images that enhance measurement accuracy.
Career Highlights
Nitin is currently employed at Applied Materials Israel Limited, where he applies his expertise in metrology and imaging technologies. His innovative approach has positioned him as a valuable asset in the field of electron beam examination.
Collaborations
Nitin has collaborated with notable colleagues, including Bobin Mathew Skaria and Anirban Ghosh, contributing to advancements in their shared field of expertise.
Conclusion
Nitin Singh Malik's contributions to electron beam examination technology exemplify the impact of innovation in metrology measurement. His patent reflects a commitment to enhancing imaging techniques, showcasing his role as a leading inventor in this specialized area.