Bengaluru, India

Niranjan Amrutur Subba Rao

This inventor holds 1 USPTO granted patent and 6 published patent applications. Top assignee: Honeywell International Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Niranjan Amrutur Subba Rao. Retrieved from https://idiyas.com/inventor/niranjan-amrutur-subba-rao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Niranjan Amrutur Subba Rao and Battery Electrode Inspection

Introduction

Niranjan Amrutur Subba Rao is an inventor associated with Bengaluru, India, and Honeywell International Inc. His patent work includes a technique for detecting lane edges on battery electrode sheets.

Latest Patents

Subba Rao is associated with 1 patent: “Lane Edge Detection in an Electrode Sheet of a Battery.” The invention uses scan data representing coating thickness across bins arranged in rows and columns on an electrode sheet. It calculates average coating thicknesses for columns and a selected group of columns, then uses those values and a standard deviation to estimate a minimum edge coating thickness. Comparing that estimate with each column’s average helps identify the transition between coated and uncoated regions and determine the lane edge.

Career Highlights

His listed patent reflects work on measurement-based detection methods for battery electrode manufacturing. The approach is designed to identify coating boundaries from thickness data across the sheet.

Collaborations

Subba Rao’s listed coworkers include Sunil Golani and Murali D. His company affiliation is Honeywell International Inc.

Conclusion

Niranjan Amrutur Subba Rao’s patent describes a data-driven method for locating coating lane edges on battery electrode sheets, supporting inspection of electrode manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…