Bad Saarow, Germany

Nino Walenta

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Id Quantique Sa. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nino Walenta. Retrieved from https://idiyas.com/inventor/nino-walenta-lf0tv28l

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Nino Walenta: Innovator in Quantum Technology

Introduction

Nino Walenta is a prominent inventor based in Bad Saarow, Germany. He has made significant contributions to the field of quantum technology, particularly in the area of quantum bit error rate minimization. His innovative approach has the potential to enhance the reliability of quantum communication systems.

Latest Patents

Nino Walenta holds a patent for a method aimed at minimizing quantum bit error rates. The invention relates to an IM bias voltage determining method that is designed to ascertain an IM bias voltage corresponding to a desired Quantum Bit Error Rate (QBER). The formula used in this method involves Q(V), which is the QBER dependent on the IM bias voltage V, Q as the optimal minimal QBER, R as the number of erroneous detections, and C as the number of correct detections.

Career Highlights

Nino Walenta is associated with Id Quantique SA, a company known for its advancements in quantum technologies. His work at the company has positioned him as a key player in the development of innovative solutions that address critical challenges in quantum communication.

Collaborations

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Conclusion

Nino Walenta's contributions to quantum technology through his patent on quantum bit error rate minimization exemplify his innovative spirit and dedication to advancing the field. His work continues to influence the development of more reliable quantum communication systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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