Ningning Pan

Title: Ningning Pan: Innovator in Ellipsometry Measurement

Introduction

Ningning Pan is a prominent inventor based in Shanghai, China. She has made significant contributions to the field of ellipsometry measurement, showcasing her expertise through innovative methods and systems.

Latest Patents

Ningning Pan holds a patent for a "Method and apparatus for ellipsometry measurement." This invention provides methods and systems designed to avoid the rotation action with the polarizer and the analyzer in complex ellipsometric measurements. The approach involves polarizing incident light at a fixed azimuthal angle, illuminating the target surface with this polarized light, and analyzing the surface's polarized characteristics. The system captures light intensity and phase information corresponding to the target surface, ultimately obtaining characteristic information based on the relationship between detected electromagnetic wave characteristics and light intensity.

Career Highlights

Ningning Pan is associated with Raintree Scientific Instruments (Shanghai) Corporation, where she applies her innovative skills in developing advanced measurement techniques. Her work has positioned her as a key figure in her field, contributing to the advancement of scientific instrumentation.

Collaborations

Ningning collaborates with notable colleagues, including Jiang-tao Dang and Haijun Gao, enhancing her research and development efforts through teamwork and shared expertise.

Conclusion

Ningning Pan's contributions to ellipsometry measurement reflect her dedication to innovation and scientific advancement. Her patent and collaborative efforts underscore her role as a leading inventor in her field.