Company Filing History:
Years Active: 2017-2019
Title: Innovations of Ningbo Li in Hermeticity Testing
Introduction
Ningbo Li is a notable inventor based in Beijing, China, recognized for his contributions to the field of hermeticity testing. With a total of 3 patents, he has developed innovative methods that enhance the reliability and efficiency of leak testing in electronic components.
Latest Patents
One of his latest patents is titled "Combination test method by using argon as gross-leak test tracer gas and using helium as fine-leak test tracer gas." This invention addresses the limitations of existing methods when dealing with components that have lower hermeticity and a wider range of volume. The method involves selecting between two approaches for hermeticity testing, significantly extending the maximum detection-waiting time and improving the accuracy of gross-leak and fine-leak tests.
Another significant patent is the "Method for helium mass spectrometric fine-leak test based on quantitative determination of maximum test-waiting time." This method provides a quantitative approach to determining the maximum test-waiting time during helium mass spectrometric tests, allowing for more accurate assessments of sealability in electronic components. By establishing a criterion based on the minimum helium gas exchange time constant, this invention enhances the reliability of fine-leak testing.
Career Highlights
Ningbo Li has worked with various companies, including Beijing Keyton Electronic Relay Corporation Ltd. His experience in the industry has allowed him to refine his innovative techniques and contribute to advancements in hermeticity testing.
Collaborations
Throughout his career, Ningbo Li has collaborated with notable colleagues such as Genglin Wang and Lijun Dong. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Ningbo Li's contributions to hermeticity testing through his innovative patents demonstrate his expertise and commitment to improving testing methods in the electronics industry. His work continues to influence the field and enhance the reliability of electronic components.