Yiwu, China

Ning Xu

This inventor holds 1 USPTO granted patent. Top assignees: The Hong Kong Polytechnic University, Yiwu Yingyun Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ning Xu. Retrieved from https://idiyas.com/inventor/ning-xu-e00ci4e9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ning Xu and an Intelligent Garment Pressure-Test System.

Introduction

Ning Xu is an inventor associated with Yiwu, China. Her work includes a patent for an adjustable dress-form apparatus and system designed to support garment pressure testing across multiple body sizes and shapes.

Latest Patents

The patent, “Multi-dimensional intelligent garment pressure test dress form apparatus and system, and multi-dimensional intelligent garment pressure test method,” describes a human-body model divided circumferentially into multiple units. Each unit is mounted on a movable member, and a control base moves the members together or separately to adjust the model’s dimensions and shape.

This design enables dynamic garment pressure testing without repeatedly replacing the body model. It is intended to make garment functionality measurement more adaptable and efficient. Ning Xu is credited with 1 patent.

Career Highlights

The information provided associates Ning Xu with The Hong Kong Polytechnic University and Yiwu Yingyun Technology Co., Ltd. Her patented work connects adjustable body modeling with practical garment testing.

Collaborations

Ning Xu’s listed coworkers include Rong Liu and Shumi Zhao. The available information does not specify their roles in the patent or related work.

Conclusion

Ning Xu’s patent presents an adjustable, multi-dimensional approach to garment pressure testing, with the goal of evaluating clothing across varied body sizes and shapes more efficiently.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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