SHANGHAI, China

Ning Xia

This inventor holds 1 USPTO granted patent. Top assignee: Micro Focus Lcc. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ning Xia. Retrieved from https://idiyas.com/inventor/ning-xia-6corcgny

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Ning Xia: Innovator in Device Debugging Technology

Introduction

Ning Xia is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of device debugging technology. His innovative approach has led to the development of a unique patent that enhances the efficiency of debugging operations.

Latest Patents

Ning Xia holds a patent for a "Device debugging connection control and maintenance." This invention involves receiving a connection request from a debug tool to connect to a device that requires debugging. The process includes implementing a primary socket connection via a Universal Serial Bus (USB) channel and a backup socket connection via a Wi-Fi channel. This dual connection strategy allows for effective maintenance of a debugging session during the performance of debugging operations.

Career Highlights

Ning Xia is currently employed at Micro Focus LLC, where he continues to innovate and develop solutions in the technology sector. His work focuses on improving device connectivity and debugging processes, which are crucial for software and hardware development.

Collaborations

Ning has collaborated with notable colleagues, including Wen-bin Gao and Lingli Wu, who contribute to the advancement of technology in their respective fields.

Conclusion

Ning Xia's contributions to device debugging technology exemplify the importance of innovation in the tech industry. His patent reflects a commitment to enhancing debugging processes, which is vital for developers and engineers.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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