US

Ning Liu

This inventor holds 0 USPTO granted patents, plus 1 CIPO patent.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ning Liu. Retrieved from https://idiyas.com/inventor/ning-liu-zq8i5a8e

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Title: Ning Liu - Innovator in Lateral Flow Assays

Introduction

Ning Liu is an accomplished inventor based in the United States. She has made significant contributions to the field of diagnostics, particularly through her work on lateral flow assays. Her innovative approach aims to enhance the detection and quantification of analytes in various samples.

Latest Patents

Ning Liu holds a patent for a "Lateral Flow System And Assay." This invention relates to a lateral flow assay and system, which includes a test strip designed for the detection and quantification of analytes in samples, such as those containing cells and fluid. The test strip comprises a chromatographic strip, a sample filter, a fluid-impermeable barrier, and means for providing a mobilizable detectable agent. This agent is capable of binding to the analyte or to a capture agent after capturing the analyte, allowing for effective migration and detection.

Career Highlights

Ning Liu is currently employed at Relia Diagnostic Systems, LLC, where she continues to develop innovative diagnostic solutions. Her work focuses on improving the accuracy and efficiency of lateral flow assays, which are crucial in various medical and research applications.

Collaborations

Ning Liu collaborates with notable colleagues, including Siliang Zhou and William J Rutter. These partnerships enhance her research and development efforts, contributing to advancements in diagnostic technologies.

Conclusion

Ning Liu is a pioneering inventor in the field of lateral flow assays, with a focus on improving diagnostic methods. Her contributions are vital for the advancement of medical diagnostics and research applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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