Ning Liu

Title: Ning Liu - Innovator in Electrical Impedance Tomography

Introduction

Ning Liu is a notable inventor based in Troy, NY (US). She has made significant contributions to the field of electrical engineering, particularly in the area of electrical impedance tomography (EIT). Her innovative work has led to the development of a unique patent that enhances the precision of voltage sources used in EIT systems.

Latest Patents

Ning Liu holds a patent for a "High precision voltage source for electrical impedance tomography." This EIT system comprises multiple voltage sources that supply corresponding voltages to various structures. The system includes calibration means for each voltage source and switching means to connect the calibration means to each voltage source in succession. This method allows for the calibration of respective voltages and currents, compensating for the shunt impedance of each voltage source. The calibration process ensures that all voltage sources are calibrated uniformly, enhancing the overall accuracy of the EIT system.

Career Highlights

Ning Liu is affiliated with Rensselaer Polytechnic Institute, where she continues to advance her research and innovation in electrical engineering. Her work has garnered attention for its practical applications in medical imaging and other fields that rely on precise electrical measurements.

Collaborations

Ning Liu has collaborated with esteemed colleagues, including Gary Jude Saulnier and Alexander Seth Ross. These partnerships have contributed to the advancement of her research and the successful development of her patented technology.

Conclusion

Ning Liu's contributions to electrical impedance tomography through her innovative patent demonstrate her expertise and commitment to advancing technology in her field. Her work continues to impact the realm of electrical engineering positively.