Yaroslavl, Russia

Nikolay L Lapa

This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignee: Artec Group, Inc.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nikolay L Lapa. Retrieved from https://idiyas.com/inventor/nikolay-l-lapa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 43(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Innovations of Nikolay L Lapa in 3D Measurement Technology

Introduction

Nikolay L Lapa is a notable inventor based in Jaroslavl′, Russia. He has made significant contributions to the field of three-dimensional measurement technology. His innovative approach utilizes non-contact structured light triangulation to measure the shape of material objects.

Latest Patents

Nikolay Lapa holds a patent for a "System and method for three-dimensional measurement of the shape of material objects." This system employs a light projector to project a structured light pattern onto the surface of an object. A camera captures the image of this structured light pattern, allowing for precise 3D measurements of the object's surface shape. The triangulation algorithm used in this system calculates the correspondence between the projected light and the captured image, enhancing measurement accuracy.

Career Highlights

Lapa is associated with Artec Group, Inc., a company known for its advancements in 3D scanning technology. His work at Artec Group has positioned him as a key player in the development of innovative measurement solutions.

Collaborations

One of his notable collaborators is Yury A Brailov, with whom he has worked on various projects related to 3D measurement technologies.

Conclusion

Nikolay L Lapa's contributions to 3D measurement technology exemplify the impact of innovative thinking in engineering. His patent and work at Artec Group, Inc. highlight the importance of advancements in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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