Zurich, Switzerland

Nikola Dordevic

This inventor holds 1 USPTO granted patent. Top assignee: Ams International Ag. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nikola Dordevic. Retrieved from https://idiyas.com/inventor/nikola-dordevic

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nikola Dordevic - Innovator in Self-Mixing Interferometry

Introduction

Nikola Dordevic is an inventor based in Zurich, Switzerland. He has made significant contributions to the field of self-mixing interferometry. His innovative approach focuses on enhancing measurement arrangements through advanced calibration methods.

Latest Patent Applications

Nikola Dordevic's notable patent application is titled "METHOD FOR CALIBRATING A SELF-MIXING INTERFEROMETER AND SELF-MIXING INTERFERENCE MEASUREMENT ARRANGEMENT." This application describes a method that includes providing a self-mixing interferometer with a laser diode. The laser diode emits laser light and receives a reflected portion of that light to modulate its optical power. The interferometer's transfer function has fringes, and the method involves locking the phase of the laser light to at least one of these fringes to establish an operating point. An interrogation signal is generated to change the wavelength of the laser light, which helps obtain a response signal indicative of the offset from a desired operating point. A compensation signal is then generated based on this response signal.

Conclusion

Nikola Dordevic's work in self-mixing interferometry showcases his innovative spirit and dedication to advancing measurement technologies. His contributions, particularly through his latest patent application, highlight the potential for improved calibration methods in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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